Search results
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 81 - 84
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 72 - 78
IEEE Photonics Technology Letters > 2018 > 30 > 1 > 59 - 62
IEEE Electron Device Letters > 2017 > 38 > 12 > 1712 - 1715
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 799 - 801
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4400 - 4407
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4354 - 4362
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4137 - 4143
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3528 - 3533
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 526 - 530
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3794 - 3801
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3077 - 3083
IEEE Electron Device Letters > 2017 > 38 > 7 > 867 - 870